You can use these professional JTAG tools to quickly assess the thoroughness of the test during development and to make improvements prior to release.īuilding high speed memory cluster and connectivity tests with CTPG_M and a supporting CoreCommander module that allows communication with your device’s internal IP is all that is needed to build high-speed memory and connectivity cluster tests in ProVision. ProVision’s development features are tightly integrated with JTAG Technologies’ advanced test coverage analysis tool and also with JTAG Visualizer graphical display system for design schematics and layouts.

ProVision comes with a built-in boundary-scan test sequencer for production ready test plans All applications can be optimized, validated and run within the ProVision environment prior to delivery of the finished test sequences to the manufacturing and/or testing facility. With the ProVision boundary-scan software suite you can rapidly generate a wide range of test and programming applications using a project database built up from the inputs above. Other key data inputs are JTAG device BSDL (description) models and a large, well-maintained model library describing thousands of non-JTAG devices including memories, bus logic, and other active and passive parts. This integrated professional JTAG boundary-scan development environment (IDE) software tool is fully automated and supports the import of design data from over 30 different EDA and CAD/CAM systems. The JTAG Provision Boundary-scan Integrated Development Environment (IDE) is a test and programming application development suite that is used during product development, production and manufacturing to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems.

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